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Abramovici, Miron

Digital systems testing and testable design - Delhi Jaico Publishing House 2009 - 652p.

ISBN: 9788172248918

Subjects--Topical Terms:
ELECTRONICS

Subjects--Index Terms: LOGIC SIMULATION, TESTING FOR SINGLE STUCK FAULTS, TESTING FOR BRIDGING FAULTS, DESIGN FOR TESTABILITY

Dewey Class. No.: 621.3815 / ABR