000 -LEADER |
fixed length control field |
00533nam a2200181Ia 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
SGT |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9788172248918 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3815 |
Item number |
ABR |
100 ## - MAIN ENTRY--PERSONAL NAME |
Personal name |
Abramovici, Miron |
245 ## - TITLE STATEMENT |
Title |
Digital systems testing and testable design |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Name of publisher, distributor, etc |
Jaico Publishing House |
Place of publication, distribution, etc |
Delhi |
Year of Publication |
2009 |
300 ## - PAGE DESCRIPTION |
No. of Pages |
652p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
ELECTRONICS |
653 ## - KEYWORDS--INDEX TERM |
Keyword term |
LOGIC SIMULATION, TESTING FOR SINGLE STUCK FAULTS, TESTING FOR BRIDGING FAULTS, DESIGN FOR TESTABILITY |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Breuer, Melvin |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Friedman,Arthur |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
|
Koha item type |
Books |