TY  - BOOK
AU  - Abramovici, Miron
AU  - Breuer, Melvin
AU  - Friedman,Arthur
TI  - Digital systems testing and testable design
SN  - 9788172248918
U1  - 621.3815 
PY  - 2009///
CY  - Delhi
PB  - Jaico Publishing House
KW  - ELECTRONICS
KW  - LOGIC SIMULATION, TESTING FOR SINGLE STUCK FAULTS, TESTING FOR BRIDGING FAULTS, DESIGN FOR TESTABILITY
ER  -