000 00533nam a2200181Ia 4500
003 SGT
020 _a9788172248918
082 _a621.3815
_bABR
100 _aAbramovici, Miron
245 _aDigital systems testing and testable design
260 _bJaico Publishing House
_aDelhi
_c2009
300 _a652p.
650 _aELECTRONICS
653 _aLOGIC SIMULATION, TESTING FOR SINGLE STUCK FAULTS, TESTING FOR BRIDGING FAULTS, DESIGN FOR TESTABILITY
700 _aBreuer, Melvin
700 _aFriedman,Arthur
942 _2ddc
_cBK
999 _c5109
_d5109