000 | 00533nam a2200181Ia 4500 | ||
---|---|---|---|
003 | SGT | ||
020 | _a9788172248918 | ||
082 |
_a621.3815 _bABR |
||
100 | _aAbramovici, Miron | ||
245 | _aDigital systems testing and testable design | ||
260 |
_bJaico Publishing House _aDelhi _c2009 |
||
300 | _a652p. | ||
650 | _aELECTRONICS | ||
653 | _aLOGIC SIMULATION, TESTING FOR SINGLE STUCK FAULTS, TESTING FOR BRIDGING FAULTS, DESIGN FOR TESTABILITY | ||
700 | _aBreuer, Melvin | ||
700 | _aFriedman,Arthur | ||
942 |
_2ddc _cBK |
||
999 |
_c5109 _d5109 |